D. Streit, A. Oki, T. Block, D. Lammert, M. Hoppe, D. Umemoto, M. Wojtowicz
{"title":"Technology and production of HBT epitaxial material","authors":"D. Streit, A. Oki, T. Block, D. Lammert, M. Hoppe, D. Umemoto, M. Wojtowicz","doi":"10.1109/MTTTWA.1997.595126","DOIUrl":null,"url":null,"abstract":"We report sustained high-yield, high-volume production of HBT epitaxial material and devices for commercial applications. We also report the use of nondestructive material characterization to predict the performance of the fabricated devices.","PeriodicalId":264044,"journal":{"name":"1997 IEEE MTT-S Symposium on Technologies for Wireless Applications Digest","volume":"73 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1997-02-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1997 IEEE MTT-S Symposium on Technologies for Wireless Applications Digest","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MTTTWA.1997.595126","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
We report sustained high-yield, high-volume production of HBT epitaxial material and devices for commercial applications. We also report the use of nondestructive material characterization to predict the performance of the fabricated devices.