Minimization of noise temperature for the hot-electron mixer

H. Newman, W. J. Moore, D. Webb
{"title":"Minimization of noise temperature for the hot-electron mixer","authors":"H. Newman, W. J. Moore, D. Webb","doi":"10.1109/irmm.1983.9126438","DOIUrl":null,"url":null,"abstract":"The principal factors which limit the bandwidth and noise temperature of a hot-electron mixer have been calculated. The minimum mixer contribution to the effective noise temperature is found to be 33 TLattice. under matched conditions, in good agreement with previously published experiments.","PeriodicalId":314918,"journal":{"name":"1983 Eighth International Conference on Infrared and Millimeter Waves","volume":"121 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1983-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1983 Eighth International Conference on Infrared and Millimeter Waves","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/irmm.1983.9126438","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

The principal factors which limit the bandwidth and noise temperature of a hot-electron mixer have been calculated. The minimum mixer contribution to the effective noise temperature is found to be 33 TLattice. under matched conditions, in good agreement with previously published experiments.
热电子混频器噪声温度的最小化
计算了限制热电子混频器带宽和噪声温度的主要因素。发现混频器对有效噪声温度的最小贡献为33 TLattice。在匹配的条件下,与先前发表的实验结果很好地吻合。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信