Negative phase shift in a layered metal-dielectric structure: Theory and experiment

Abstract

Measurements of the negative optical phase shifts of Ag/TiO2 and Ag/SiO2 bilayer films have been carried out with the modified walk-off interferometer. Appearance and monotonic rise of the phase shift anisotropy for p- and s-polarization by increasing incidence angle has been revealed experimentally. The results of measurements have shown rather good coincidence with theoretical calculations.