{"title":"Analysis of Power Holes in Helix Traveling-Wave Tubes with Non-Uniform Delay-Lines","authors":"Moritz Hägermann, M. Wulff, P. Birtel, A. Jacob","doi":"10.1109/IVEC45766.2020.9520488","DOIUrl":null,"url":null,"abstract":"The influence of non-uniform delay lines on the parasitic effect of power holes in helix traveling-wave tubes is investigated. For the analysis, we introduce a helix geometry which favors power hole occurrence. The harmonic backward-wave is assumed to be excited through output-coupler mismatch. Whereas homogeneous delay lines can only cause a single power hole, the analysis shows that tapered helices may lead to multiple gain dips at different frequencies where each power hole can be assigned to a section of the delay line.","PeriodicalId":170853,"journal":{"name":"2020 IEEE 21st International Conference on Vacuum Electronics (IVEC)","volume":"356 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-10-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 IEEE 21st International Conference on Vacuum Electronics (IVEC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IVEC45766.2020.9520488","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
The influence of non-uniform delay lines on the parasitic effect of power holes in helix traveling-wave tubes is investigated. For the analysis, we introduce a helix geometry which favors power hole occurrence. The harmonic backward-wave is assumed to be excited through output-coupler mismatch. Whereas homogeneous delay lines can only cause a single power hole, the analysis shows that tapered helices may lead to multiple gain dips at different frequencies where each power hole can be assigned to a section of the delay line.