Olympia Axelou, Eleni Tselepi, G. Floros, N. Evmorfopoulos, G. Stamoulis
{"title":"PROTON – A Python Framework for Physics-Based Electromigration Assessment on Contemporary VLSI Power Grids","authors":"Olympia Axelou, Eleni Tselepi, G. Floros, N. Evmorfopoulos, G. Stamoulis","doi":"10.1109/SMACD58065.2023.10192229","DOIUrl":null,"url":null,"abstract":"Electromigration (EM) is a significant reliability concern in modern circuit design practices that poses a considerable risk to the long-term reliability of contemporary integrated circuits and attracts attention from the EDA industry. Hence, the development of a robust, industrial-level EM analysis tool is crucial. In order to address this challenge, we present PROTON, an open-source tool that can be straightforwardly integrated into industrial design flows covering a wide spectrum of EM analysis needs. On top of this, it offers an intuitive graphical user interface with a high level of automation that allows the visualization of EM stress analysis on power grid designs. The core of PROTON incorporates state-of-the-art methodologies for physics-based EM stress analysis which provide robustness and scalability in handling large-scale power grid designs. These are experimentally verified in comparison with the industrial tool COMSOL on multiple benchmarks where PROTON demonstrated a speedup of ×685 with negligible loss in accuracy.","PeriodicalId":239306,"journal":{"name":"2023 19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD)","volume":"14 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2023-07-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2023 19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SMACD58065.2023.10192229","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Electromigration (EM) is a significant reliability concern in modern circuit design practices that poses a considerable risk to the long-term reliability of contemporary integrated circuits and attracts attention from the EDA industry. Hence, the development of a robust, industrial-level EM analysis tool is crucial. In order to address this challenge, we present PROTON, an open-source tool that can be straightforwardly integrated into industrial design flows covering a wide spectrum of EM analysis needs. On top of this, it offers an intuitive graphical user interface with a high level of automation that allows the visualization of EM stress analysis on power grid designs. The core of PROTON incorporates state-of-the-art methodologies for physics-based EM stress analysis which provide robustness and scalability in handling large-scale power grid designs. These are experimentally verified in comparison with the industrial tool COMSOL on multiple benchmarks where PROTON demonstrated a speedup of ×685 with negligible loss in accuracy.