Simulation of integrated circuit immunity with LECCS model

K. Ichikawa, Masashi Inagaki, Y. Sakurai, Isao Iwase, Makoto Nagata, Osami Wada
{"title":"Simulation of integrated circuit immunity with LECCS model","authors":"K. Ichikawa, Masashi Inagaki, Y. Sakurai, Isao Iwase, Makoto Nagata, Osami Wada","doi":"10.1109/EMCZUR.2006.214932","DOIUrl":null,"url":null,"abstract":"We have been developing an LSI model for EMC simulation in electronic control units. EMI simulations have been applied to some units using an LSI EMI model. These models have been called the LECCS Model and ICEM Model, but there are few examples of EMS simulation in printed circuit boards. Therefore , we studied the LSI EMS model and attempted to perform an EMS simulation of a printed circuit board. The LSI was tested through the DPI method (IEC61967-4). The EMS in this test system was analyzed, and the usefulness of this method of analysis was confirmed. The analysis was also applied to a product","PeriodicalId":130489,"journal":{"name":"2006 17th International Zurich Symposium on Electromagnetic Compatibility","volume":"5 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-05-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"27","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2006 17th International Zurich Symposium on Electromagnetic Compatibility","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EMCZUR.2006.214932","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 27

Abstract

We have been developing an LSI model for EMC simulation in electronic control units. EMI simulations have been applied to some units using an LSI EMI model. These models have been called the LECCS Model and ICEM Model, but there are few examples of EMS simulation in printed circuit boards. Therefore , we studied the LSI EMS model and attempted to perform an EMS simulation of a printed circuit board. The LSI was tested through the DPI method (IEC61967-4). The EMS in this test system was analyzed, and the usefulness of this method of analysis was confirmed. The analysis was also applied to a product
集成电路抗扰度的LECCS模型仿真
我们一直在开发一种用于电子控制单元电磁兼容仿真的大规模集成电路模型。电磁干扰仿真已经应用于一些使用LSI电磁干扰模型的单元。这些模型被称为LECCS模型和ICEM模型,但在印刷电路板上进行EMS仿真的例子很少。因此,我们研究了LSI EMS模型,并尝试对印刷电路板进行EMS仿真。通过DPI法(IEC61967-4)对LSI进行了测试。对该测试系统中的EMS进行了分析,验证了该分析方法的有效性。该分析还应用于一种产品
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信