SEREEL2 – making laser single-event effects testing available to the many

Abstract

This paper describes the phenomenon of single-event effects caused by the passage of a high energy particle through the silicon die of a semiconductor device. It goes on to outline the significance of these effects and the situations in which single-event effects can occur, followed by a summary of current testing and characterisation practices for determining the sensitivity of components to such events. Finally, the use of a relatively new technique for SEE testing, employing a pulsed laser, is introduced and examples quoted where such a technique has delivered benefits compared to more established methods. Laser testing promises to deliver much faster and lower cost results, opening up access to SEE testing to a wider range of users than is currently the case.