M. Contreras, H. Wiesner, D. Niles, K. Ramanathan, R. Matson, J. Tuttle, J. Keane, R. Noufi
{"title":"Defect chalcopyrite Cu(In/sub 1-x/Ga/sub x/)/sub 3/Se/sub 5/ materials and high Ga-content Cu(In,Ga)Se/sub 2/-based solar cells","authors":"M. Contreras, H. Wiesner, D. Niles, K. Ramanathan, R. Matson, J. Tuttle, J. Keane, R. Noufi","doi":"10.1109/PVSC.1996.564251","DOIUrl":null,"url":null,"abstract":"Crystallographic, optical, and electrical properties of defect chalcopyrite Cu(In/sub 1-x/Ga)/sub 3/Se/sub 5/ (0<x<1) materials in polycrystalline thin-film form are reported. Also, an energy band alignment between such materials and CdS has been calculated from X-ray photoelectron spectroscopy data. A comparison of some properties against published data on similarly prepared chalcopyrite CuIn/sub 1-x/Ga/sub x/Se/sub 2/ absorber materials is presented. Considering the chalcopyrite/defect chalcopyrite junction model, we postulate that the traditionally poor device performance of uniform high-Ga-content absorbers (x>0.3) is due to a relatively inferior character-both structural and electrical-at the very chalcopyrite/defect chalcopyrite interface. We demonstrate that this situation can be circumvented (for absorbers with x>0.3) by properly engineering such an interface by reducing Ga content in the region near the surface of the absorber.","PeriodicalId":410394,"journal":{"name":"Conference Record of the Twenty Fifth IEEE Photovoltaic Specialists Conference - 1996","volume":"65 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1996-05-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Conference Record of the Twenty Fifth IEEE Photovoltaic Specialists Conference - 1996","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/PVSC.1996.564251","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 7
Abstract
Crystallographic, optical, and electrical properties of defect chalcopyrite Cu(In/sub 1-x/Ga)/sub 3/Se/sub 5/ (00.3) is due to a relatively inferior character-both structural and electrical-at the very chalcopyrite/defect chalcopyrite interface. We demonstrate that this situation can be circumvented (for absorbers with x>0.3) by properly engineering such an interface by reducing Ga content in the region near the surface of the absorber.