Interfacial reactions, microstructure and mechanical properties of Pb-free solder joints in PBGA laminates

S.K. Kang, W. K. Choi, D. Shih, P. Lauro, D. W. Henderson, T. Gosselin, D. Leonard
{"title":"Interfacial reactions, microstructure and mechanical properties of Pb-free solder joints in PBGA laminates","authors":"S.K. Kang, W. K. Choi, D. Shih, P. Lauro, D. W. Henderson, T. Gosselin, D. Leonard","doi":"10.1109/ECTC.2002.1008088","DOIUrl":null,"url":null,"abstract":"Sn-based alloys have been developed as Pb-free solder candidates to replace the Pb-containing solders used in microelectronic applications. However, their high Sn content and high melting point often cause excessive interfacial reactions, namely, dissolution of surface finish layers and concomitant formation of intermetallic compounds at the soldering interface. These interfacial reactions can therefore influence the microstructure and mechanical properties of the solder joints and eventually their reliability. The choice of a proper surface finish layer in printed circuit boards is an important issue in successfully introducing the Sn-based, Pb-free solders. The effects of surface finish layers and multiple reflows on the BGA solder joints have been investigated. A Pb-free solder alloy, Sn-Ag-Cu has been employed as the solder ball material. Five types of surface finish on opposite sides of the BGA balls, have been investigated. Intermetallic compound formation was measured as a function of reflow cycle. The effects of the interfacial reactions on the microstructure and mechanical properties of the solder joints were also investigated as a function of surface finish and reflow cycle.","PeriodicalId":285713,"journal":{"name":"52nd Electronic Components and Technology Conference 2002. (Cat. No.02CH37345)","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"24","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"52nd Electronic Components and Technology Conference 2002. (Cat. No.02CH37345)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ECTC.2002.1008088","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 24

Abstract

Sn-based alloys have been developed as Pb-free solder candidates to replace the Pb-containing solders used in microelectronic applications. However, their high Sn content and high melting point often cause excessive interfacial reactions, namely, dissolution of surface finish layers and concomitant formation of intermetallic compounds at the soldering interface. These interfacial reactions can therefore influence the microstructure and mechanical properties of the solder joints and eventually their reliability. The choice of a proper surface finish layer in printed circuit boards is an important issue in successfully introducing the Sn-based, Pb-free solders. The effects of surface finish layers and multiple reflows on the BGA solder joints have been investigated. A Pb-free solder alloy, Sn-Ag-Cu has been employed as the solder ball material. Five types of surface finish on opposite sides of the BGA balls, have been investigated. Intermetallic compound formation was measured as a function of reflow cycle. The effects of the interfacial reactions on the microstructure and mechanical properties of the solder joints were also investigated as a function of surface finish and reflow cycle.
PBGA层合板中无铅焊点的界面反应、微观结构和力学性能
锡基合金作为无铅钎料已被开发出来,以取代微电子应用中使用的含铅钎料。然而,它们的高锡含量和高熔点往往会引起过多的界面反应,即表面光饰层的溶解,并伴随在焊接界面形成金属间化合物。因此,这些界面反应会影响焊点的微观结构和机械性能,并最终影响其可靠性。在印刷电路板中选择合适的表面光洁度层是成功引入锡基无铅焊料的一个重要问题。研究了表面处理层和多次回流对BGA焊点性能的影响。采用无铅钎料合金Sn-Ag-Cu作为钎料球材料。研究了BGA球的5种不同的表面处理方法。金属间化合物形成作为回流循环的函数进行了测量。研究了界面反应对焊点组织和力学性能的影响,并将其作为表面光洁度和回流循环的函数。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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