{"title":"A full band 18–225 GHz scalar network analyzer","authors":"P. Goy, M. Gross, J. Raimond","doi":"10.1109/irmm.1987.9127061","DOIUrl":null,"url":null,"abstract":"A Millimeter Scalar Network Analyzer (MSNA), based on a new concept, permits to cover the whole 18-225 GHz interval without any drawer to change, and avoiding the problem of the many expensive sources usually needed. Transmission measurements are performed very easily at any frequency within minutes, with a dynamic range over 6odB up to 160 GHz, and above 40 dB up to 225 GHz. Small power attenuation changes (down to 10−4) can be detected when applying an external modulation. Many applications concern the test of various millimeter components (wave guides, attenuators, cavities, antennas…), the characterization of materials (dielectrics…), the spectroscopy of solids, atoms and molecules.","PeriodicalId":399243,"journal":{"name":"1987 Twelth International Conference on Infrared and Millimeter Waves","volume":"10 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1987-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1987 Twelth International Conference on Infrared and Millimeter Waves","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/irmm.1987.9127061","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4
Abstract
A Millimeter Scalar Network Analyzer (MSNA), based on a new concept, permits to cover the whole 18-225 GHz interval without any drawer to change, and avoiding the problem of the many expensive sources usually needed. Transmission measurements are performed very easily at any frequency within minutes, with a dynamic range over 6odB up to 160 GHz, and above 40 dB up to 225 GHz. Small power attenuation changes (down to 10−4) can be detected when applying an external modulation. Many applications concern the test of various millimeter components (wave guides, attenuators, cavities, antennas…), the characterization of materials (dielectrics…), the spectroscopy of solids, atoms and molecules.