Accumulation of charges in polycarbonate due to positron irradiation

D. Cangialosi, H. Schut, M. Wubbenhorst, J. van Turnhout, A. van Veen
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引用次数: 16

Abstract

Positron annihilation lifetime spectroscopy (PALS) is a powerful technique for the study of free volume in polymers. The lifetime of ortho-positronium (o-Ps), a bound state of an electron and a positron, can be used to assess the cavity size, while the intensity can be used to characterize the number of cavities. In the past results have been published, which suffer from artifacts, whereby the drop in o-Ps intensity is not related to a decrease in the number of cavities. One of the possible artifacts is the build-up of an internal charge during long-term exposure to positron irradiation, which affects the o-Ps intensity. In this study we focus on the charging created in polycarbonate (PC) by positron radiation, which we investigated by the laser intensity modulation method (LIMM) and by charge-decay experiments, both isothermally and with TSD. From these measurements we conclude that: 1) the o-Ps intensity decrease during prolonged positron irradiation is due to the accumulation of a space charge; 2) in reverse, changes in the o-Ps intensity may be used to probe electric fields in dielectrics.
由于正电子辐照聚碳酸酯中电荷的积累
正电子湮灭寿命光谱(PALS)是研究聚合物中自由体积的一种强有力的技术。邻正电子的寿命(o-Ps)是电子和正电子的结合态,可以用来评估空腔的大小,而强度可以用来表征空腔的数量。在过去已发表的结果中,受到伪影的影响,即o-Ps强度的下降与空腔数量的减少无关。其中一个可能的伪影是在长期暴露于正电子照射时内部电荷的积累,这会影响o-Ps的强度。本文主要研究了正电子辐射在聚碳酸酯(PC)中产生的电荷,采用激光强度调制方法(LIMM)和等温和TSD电荷衰减实验研究了正电子辐射在聚碳酸酯(PC)中的电荷。从这些测量我们得出结论:1)在长时间的正电子辐照过程中,o-Ps强度的降低是由于空间电荷的积累;2)反过来,o-Ps强度的变化可以用来探测电介质中的电场。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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