{"title":"Enhanced imaging arrays using a sigma delta ADC in Si CMOS for each array pixel","authors":"M. Brooke","doi":"10.1109/LEOSST.2000.869677","DOIUrl":null,"url":null,"abstract":"Recently we have demonstrated a compact current input oversampling modulator for scalable high frame rate focal plane arrays that enables frame rates over 100 kfps operating in continuous imaging mode. All the circuits including data lines and detectors were laid-out to fit into 125 /spl mu/m/spl times/125 /spl mu/m space using 0.8 /spl mu/m CMOS technology. This compact converter also provides improvement in noise filtering performance over imagers that use capacitance at each pixel to convert detector current to voltage. This technique may allow noisy detectors to be used at high temperatures with good image quality.","PeriodicalId":415720,"journal":{"name":"2000 Digest of the LEOS Summer Topical Meetings. Electronic-Enhanced Optics. Optical Sensing in Semiconductor Manufacturing. Electro-Optics in Space. Broadband Optical Networks (Cat. No.00TH8497)","volume":"3 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-07-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2000 Digest of the LEOS Summer Topical Meetings. Electronic-Enhanced Optics. Optical Sensing in Semiconductor Manufacturing. Electro-Optics in Space. Broadband Optical Networks (Cat. No.00TH8497)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/LEOSST.2000.869677","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
Recently we have demonstrated a compact current input oversampling modulator for scalable high frame rate focal plane arrays that enables frame rates over 100 kfps operating in continuous imaging mode. All the circuits including data lines and detectors were laid-out to fit into 125 /spl mu/m/spl times/125 /spl mu/m space using 0.8 /spl mu/m CMOS technology. This compact converter also provides improvement in noise filtering performance over imagers that use capacitance at each pixel to convert detector current to voltage. This technique may allow noisy detectors to be used at high temperatures with good image quality.