K. Petrosyants, E. Orekhov, D. Popov, I. Kharitonov, L. Sambursky, A. P. Yatmanov, A. Voevodin, A. Mansurov
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引用次数: 1
Abstract
A comparison of delay time (td) for n- and p-MOSFETs switches with silicon on sapphire (SOS), silicon on insulator (SOI) and bulk silicon structures is presented. Two step TCAD-SPICE simulation procedure was used to define td for the set of 3.0…0.25 um MOSFETs fabricated by the three mentioned technologies. It was shown that 0.5 um Peregrine UTSi SOS n- and p-MOSFET provided the td reduction of 220–240% in comparison with bulk silicon and 20–25% with SOI.
比较了蓝宝石上硅(SOS)、绝缘体上硅(SOI)和体硅结构的n- mosfet和p- mosfet开关的延迟时间(td)。采用两步TCAD-SPICE仿真程序定义了三种技术制备的3.0…0.25 um mosfet的td。结果表明,与大块硅相比,0.5 um Peregrine UTSi SOS n-和p-MOSFET的td降低了220-240%,与SOI相比降低了20-25%。