Fe-INDUCED CHANGE OF ELECTRON AFFINITY AND SECONDARY ELECTRON YIELD ON DIAMOND

Abstract

Fe films grown on clean diamond (100) have been studied using synchrotron-based X-ray photoemission spectroscopy (XPS) and ultra-violet photoemission spectroscopy (UPS). The work function and secondary electron yield (SEY) in UPS of the sample were found to change strongly as Fe film thickness increases. After the deposition of about one monolayer Fe, which was found to react with diamond by XPS, work function reaches its minimum while SEY reaches its maximum due to the formation of a dipole layer between the chemisorbed Fe and C atoms at the interface. This study could help the development of high emittance spin-polarized electron source based on magnetic thin films grown on diamond with low or negative electron affinity.