Characterisation of iridium and low-density bilayer coatings for the Athena optics

S. Svendsen, S. Massahi, D. Ferreira, N. Gellert, Arne 'S Jegers, F. Christensen, A. Thete, B. Landgraf, M. Collon, E. Handick, D. Skroblin, L. Cibik, C. Gollwitzer, M. Krumrey, I. Ferreira, B. Shortt, M. Bavdaz
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引用次数: 4

Abstract

The future Athena observatory will feature optics with unprecedented collecting area enabled by silicon pore optics technology. In order to achieve the telescope effective area requirements at 1 keV and 7 keV, thin film coatings of iridium with a low-density overcoat are deposited onto the mirror substrates. Assembling the coated silicon pore optics plates into mirror modules for the Athena optics requires wet chemical processing and thermal annealing. While iridium appears to be compatible with the post-coating processes, previous studies have shown degradation of the low-density material. The overcoat layer is particularly critical for the low-energy telescope performance, so several candidate materials (boron carbide, silicon carbide and carbon) have been studied to identify a compatible thin film design. We present the characterisation of x-ray mirror performance using x-ray reflectometry, as well as the measurements of residual film stress with stylus profilometry. Furthermore, we evaluate the effects of post-coating treatment in order to recommend the most suitable overcoat material for the telescope.
雅典娜光学用铱和低密度双层涂层的表征
未来的雅典娜天文台将采用硅孔光学技术,具有前所未有的收集面积。为了达到望远镜在1 keV和7 keV下的有效面积要求,在镜面基底上沉积了低密度涂层的铱薄膜涂层。将涂层硅孔光学板组装成Athena光学的镜像模块需要湿化学处理和热退火。虽然铱似乎与后涂层工艺兼容,但先前的研究表明低密度材料会降解。大衣层对低能望远镜的性能尤为关键,因此研究了几种候选材料(碳化硼、碳化硅和碳)来确定相容的薄膜设计。我们提出了使用x射线反射仪的x射线反射镜性能的表征,以及用手写笔轮廓术测量残余薄膜应力。此外,我们还评估了涂层后处理的效果,以推荐最适合望远镜的涂层材料。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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