M. Simons, Marcus D. Kautz, J. Gordon, C. Holloway
{"title":"Uncertainties in Rydberg Atom-Based RF E-Field Measurements","authors":"M. Simons, Marcus D. Kautz, J. Gordon, C. Holloway","doi":"10.1109/EMCEUROPE.2018.8485055","DOIUrl":null,"url":null,"abstract":"Ahstract- A Rydberg atom-based electric-field measurement approach is being investigated by several groups around the world as a means to develop a new SI-traceable RF E-field standard. For this technique to be useful it is important to understand the uncertainties. In this paper, we examine and quantify the sources of uncertainty present with this Rydberg atom-based RF electric-field measurement technique.","PeriodicalId":376960,"journal":{"name":"2018 International Symposium on Electromagnetic Compatibility (EMC EUROPE)","volume":"175 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-10-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"12","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 International Symposium on Electromagnetic Compatibility (EMC EUROPE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EMCEUROPE.2018.8485055","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 12
Abstract
Ahstract- A Rydberg atom-based electric-field measurement approach is being investigated by several groups around the world as a means to develop a new SI-traceable RF E-field standard. For this technique to be useful it is important to understand the uncertainties. In this paper, we examine and quantify the sources of uncertainty present with this Rydberg atom-based RF electric-field measurement technique.