{"title":"Computer controlled measuring center","authors":"Jung-Tang Huang, Chun-Hsien Chen, Sheng-Hsiung Shih","doi":"10.1109/COASE.2005.1506775","DOIUrl":null,"url":null,"abstract":"This paper demonstrated a novel computer controlled measuring center (CCMC) including multiple fully modular and functional measuring probes or instruments, a common multi-axis motion platform or probe station, a common digital image guiding device, and a common data acquisition and processing module. The device under test (DUT) is fixed in the fixture of the motion platform. According to the desired measuring items, the corresponding required measuring probes from different vendors are installed into a probe fetching-fixture by a probe-changing-mechanism. The probe fetching-fixture can rotate in three directions, such as pitch, roll, and yaw. Combining with the digital image guiding device the probes can align and measure the specific point or area of the DUT. In this way the CCMC can measure more than one parameter of the DUT at the same point or perform a variety of measurements with only one floor area of traditional measuring equipment.","PeriodicalId":181408,"journal":{"name":"IEEE International Conference on Automation Science and Engineering, 2005.","volume":"32 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2005-09-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE International Conference on Automation Science and Engineering, 2005.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/COASE.2005.1506775","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
This paper demonstrated a novel computer controlled measuring center (CCMC) including multiple fully modular and functional measuring probes or instruments, a common multi-axis motion platform or probe station, a common digital image guiding device, and a common data acquisition and processing module. The device under test (DUT) is fixed in the fixture of the motion platform. According to the desired measuring items, the corresponding required measuring probes from different vendors are installed into a probe fetching-fixture by a probe-changing-mechanism. The probe fetching-fixture can rotate in three directions, such as pitch, roll, and yaw. Combining with the digital image guiding device the probes can align and measure the specific point or area of the DUT. In this way the CCMC can measure more than one parameter of the DUT at the same point or perform a variety of measurements with only one floor area of traditional measuring equipment.