Impact of Ron(VDD) dependence on polar transmitter residual distortion

R. Marante, J. García, P. Cabral, J. Pedro
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Abstract

In this paper, the particular impact of switching device ON resistance variation with drain supply voltage, Ron(VDD), on polar transmitter distortion is considered. Pulsed I/V measurement results over a GaN HEMT are used to predict the deviation in the Vdd-to-AM modulation profile. System-level calculations, in the presence of other nonidealities, allow the evaluation of the relative contribution of this frequency dispersion related effect.
Ron(VDD)依赖性对极性发射机剩余畸变的影响
本文特别考虑了开关器件导通电阻随漏极电源电压Ron(VDD)变化对极性变送器畸变的影响。GaN HEMT上的脉冲I/V测量结果用于预测Vdd-to-AM调制曲线的偏差。在存在其他非理想性的情况下,系统级计算允许评估这种频率色散相关效应的相对贡献。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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