Performance analysis of a fault-tolerant crossbar molecular switch memory demultiplexer

Abstract

Nanoscale elements are fabricated using bottom-up processes, and as such they are prone to high levels of defects. Defect-tolerance will play a crucial role in the realization of practical nanoscale devices. In this paper we investigate the performance impact of combining a molecular switch junction with an ECC demultiplexer to allow for enhanced fault-tolerance. The results indicate that the molecular switch junction, which adds redundancy to the address lines, aids in reducing the delay as the redundancy increases. Further, the probability analysis also indicates that the fault tolerance improves with the combined scheme.