Modelling insight into the resonance frequencies of the microwave impedance parameters for GaAs HEMTs

G. Crupi, A. Raffo, D. Schreurs, G. Avolio, A. Caddemi, G. Vannini
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引用次数: 1

Abstract

The aim of this paper is to present a detailed and thorough investigation of the dips in the magnitude of the impedance parameters for AlGaAs/GaAs HEMTs. These dips should be attributed to the resonance between the extrinsic inductances and the intrinsic capacitances. As a consequence, the resonance frequencies associated to these dips can be analyzed to determine the intrinsic capacitances when the extrinsic inductances are known. To verify the validity of this straightforward approach, the extracted capacitances are compared with the results obtained with the conventional modelling method. The comparison is performed versus the gate-source voltage and the gate width.
对GaAs hemt微波阻抗参数共振频率的建模洞察
本文的目的是对AlGaAs/GaAs hemt阻抗参数幅度的下降进行详细而彻底的研究。这些下降应归因于外在电感和内在电容之间的共振。因此,当外部电感已知时,可以分析与这些倾角相关的共振频率以确定固有电容。为了验证这种简单方法的有效性,将提取的电容与传统建模方法得到的结果进行了比较。对栅极-源电压和栅极宽度进行比较。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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