{"title":"An Ultrasensitive Laser Microprobe for Detection of Surface Contamination","authors":"M. Duignan, C. Christensen","doi":"10.1364/laca.1992.thb5","DOIUrl":null,"url":null,"abstract":"Increasingly, modem industrial processes demand strict control of potential interferences from contaminants on substrate surfaces. Direct detection of such small amounts of contamination presents a challenging technical task, particularly if detection is to be carried out in areas that are difficult to access. We report on a new laser-based detection method for nonvolatile residue on component surfaces.","PeriodicalId":252738,"journal":{"name":"Laser Applications to Chemical Analysis","volume":"66 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Laser Applications to Chemical Analysis","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1364/laca.1992.thb5","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Increasingly, modem industrial processes demand strict control of potential interferences from contaminants on substrate surfaces. Direct detection of such small amounts of contamination presents a challenging technical task, particularly if detection is to be carried out in areas that are difficult to access. We report on a new laser-based detection method for nonvolatile residue on component surfaces.