Resistance evaluation of holographic polymer-dispersed liquid crystal memory for gamma-ray irradiation

Abstract

The radiation-hardened characteristics of holographic polymer-dispersed liquid crystal (HPDLC) memory are investigated for the applications requiring high reliability using an optically reconfigurable gate array. The optical properties and internal grating structures are investigated by using a cobalt 60 gamma radiation source to examine the resistance of 100 Mrad total-ionizing-dose.