Prediction of lumen output and chromaticity shift in LEDs using Kalman Filter and Extended Kalman Filter based models

P. Lall, Junchao Wei, Lynn Davis
{"title":"Prediction of lumen output and chromaticity shift in LEDs using Kalman Filter and Extended Kalman Filter based models","authors":"P. Lall, Junchao Wei, Lynn Davis","doi":"10.1109/ICPHM.2013.6621457","DOIUrl":null,"url":null,"abstract":"Solid-state lighting (SSL) luminaires containing light emitting diodes (LEDs) have the potential of seeing excessive temperatures when being transported across country or being stored in non-climate controlled warehouses. They are also being used in outdoor applications in desert environments that see little or no humidity but will experience extremely high temperatures during the day. This makes it important to increase our understanding of what effects high temperature exposure for a prolonged period of time will have on the usability and survivability of these devices. Traditional light sources “burn out” at end-of-life. For an incandescent bulb, the lamp life is defined by B50 life. However, the LEDs have no filament to “burn”. The LEDs continually degrade and the light output decreases eventually below useful levels causing failure. Presently, the TM-21 test standard is used to predict the L70 life of LEDs from LM-80 test data. Several failure mechanisms may be active in a LED at a single time causing lumen depreciation. The underlying TM-21 Model may not capture the failure physics in presence of multiple failure mechanisms. Correlation of lumen maintenance with underlying physics of degradation at system-level is needed. In this paper, Kalman Filter (KF) and Extended Kalman Filters (EKF) have been used to develop a 70-percent Lumen Maintenance Life Prediction Model for LEDs used in SSL luminaires. Ten-thousand hour LM-80 test data for various LEDs have been used for model development. System state at each future time has been computed based on the state space at preceding time step, system dynamics matrix, control vector, control matrix, measurement matrix, measured vector, process noise and measurement noise. The future state of the lumen depreciation has been estimated based on a second order Kalman Filter model and a Bayesian Framework. Life prediction of L70 life for the LEDs used in SSL luminaires from KF and EKF based models have been compared with the TM-21 model predictions and experimental data.","PeriodicalId":178906,"journal":{"name":"2013 IEEE Conference on Prognostics and Health Management (PHM)","volume":"9 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-06-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 IEEE Conference on Prognostics and Health Management (PHM)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICPHM.2013.6621457","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 8

Abstract

Solid-state lighting (SSL) luminaires containing light emitting diodes (LEDs) have the potential of seeing excessive temperatures when being transported across country or being stored in non-climate controlled warehouses. They are also being used in outdoor applications in desert environments that see little or no humidity but will experience extremely high temperatures during the day. This makes it important to increase our understanding of what effects high temperature exposure for a prolonged period of time will have on the usability and survivability of these devices. Traditional light sources “burn out” at end-of-life. For an incandescent bulb, the lamp life is defined by B50 life. However, the LEDs have no filament to “burn”. The LEDs continually degrade and the light output decreases eventually below useful levels causing failure. Presently, the TM-21 test standard is used to predict the L70 life of LEDs from LM-80 test data. Several failure mechanisms may be active in a LED at a single time causing lumen depreciation. The underlying TM-21 Model may not capture the failure physics in presence of multiple failure mechanisms. Correlation of lumen maintenance with underlying physics of degradation at system-level is needed. In this paper, Kalman Filter (KF) and Extended Kalman Filters (EKF) have been used to develop a 70-percent Lumen Maintenance Life Prediction Model for LEDs used in SSL luminaires. Ten-thousand hour LM-80 test data for various LEDs have been used for model development. System state at each future time has been computed based on the state space at preceding time step, system dynamics matrix, control vector, control matrix, measurement matrix, measured vector, process noise and measurement noise. The future state of the lumen depreciation has been estimated based on a second order Kalman Filter model and a Bayesian Framework. Life prediction of L70 life for the LEDs used in SSL luminaires from KF and EKF based models have been compared with the TM-21 model predictions and experimental data.
利用卡尔曼滤波和扩展卡尔曼滤波模型预测led的流明输出和色度偏移
包含发光二极管(led)的固态照明(SSL)灯具在全国运输或储存在非气候控制仓库时可能会出现温度过高的情况。它们也被用于沙漠环境的户外应用,这些环境很少或没有湿度,但白天会经历极高的温度。这使得增加我们对长时间高温暴露对这些设备的可用性和生存能力的影响的理解变得非常重要。传统光源在使用寿命结束时“耗尽”。对于白炽灯泡,灯的寿命由B50寿命定义。然而,led没有灯丝可以“燃烧”。led不断退化,光输出最终降低到可用水平以下,导致故障。目前,采用TM-21测试标准从LM-80测试数据预测led的L70寿命。几个失效机制可能在一个LED活动在一个单一的时间导致流明衰减。潜在的TM-21模型可能无法捕捉到存在多种失效机制的失效物理。需要将管腔维持与系统级退化的潜在物理现象联系起来。本文使用卡尔曼滤波器(KF)和扩展卡尔曼滤波器(EKF)来开发用于SSL灯具的led的70%流明维护寿命预测模型。各种led的万小时LM-80测试数据已用于模型开发。基于前一时间步长的状态空间、系统动力学矩阵、控制向量、控制矩阵、测量矩阵、测量向量、过程噪声和测量噪声,计算出未来每个时间点的系统状态。基于二阶卡尔曼滤波模型和贝叶斯框架对流明衰减的未来状态进行了估计。将基于KF和EKF模型对SSL灯具中使用的led的L70寿命预测与TM-21模型预测和实验数据进行了比较。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信