Prantik Mahajan, Raunak Kumar, R. Gauthier, K. Hwang
{"title":"Optimization of GGNMOS Devices for High-Voltage ESD Protection in BCDLite Technology","authors":"Prantik Mahajan, Raunak Kumar, R. Gauthier, K. Hwang","doi":"10.23919/IEDS48938.2021.9468827","DOIUrl":null,"url":null,"abstract":"Design optimization of Electrostatic Discharge (ESD) GGNMOS for high-voltage applications in low-cost BCDLite technology is reported. Clamp performance optimization through body PWELL engineering and device design techniques are investigated. A comparative analysis between two distinct device architectures (different Poly-LOCOS overlap) showing 100ns TLP measurement and TCAD simulation results is presented.","PeriodicalId":174954,"journal":{"name":"2020 International EOS/ESD Symposium on Design and System (IEDS)","volume":"23 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-06-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 International EOS/ESD Symposium on Design and System (IEDS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.23919/IEDS48938.2021.9468827","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
Design optimization of Electrostatic Discharge (ESD) GGNMOS for high-voltage applications in low-cost BCDLite technology is reported. Clamp performance optimization through body PWELL engineering and device design techniques are investigated. A comparative analysis between two distinct device architectures (different Poly-LOCOS overlap) showing 100ns TLP measurement and TCAD simulation results is presented.