A Hall-current model of electron loss after POS opening into high-impedance loads

J. Greenly
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引用次数: 0

Abstract

A self-consistent relativistic model of laminar Hall (E*B) electron flow access of a plasma-opening-switch (POS) plasma allows a loss mechanism after opening, even in a strongly magnetically insulated line, downstream of the remaining POS plasma. Opening is assumed to occur at the cathode, either by erosion or push-back. The loss results only when a large voltage appears after opening into a high-impedance load. Then the difference in potential between the plasma, which is near anode potential, and the cathode results in an axial component of E at the load end of the plasma, which supports an E*B drift of electrons across the gap. The analytic model predicts that this loss should increase with higher voltage after opening and can be eliminated only by removing the plasma from the gap or eliminating cathode electron emission (both difficult), or by confining this downstream electron flow with an applied magnetic field.<>
高阻抗负载打开后电子损失的霍尔电流模型
等离子体打开开关(POS)等离子体的层流霍尔(E*B)电子流进入的自一致相对论模型允许打开后的损耗机制,即使在剩余POS等离子体的下游强磁绝缘线路中也是如此。假定开孔发生在阴极,要么是由于侵蚀,要么是由于推回。只有当打开高阻抗负载后出现大电压时才会产生损耗。然后,等离子体之间的电位差(接近阳极电位差)和阴极电位差导致等离子体负载端的轴向分量E,这支持电子在间隙上的E*B漂移。解析模型预测,这种损耗应该随着打开后电压的升高而增加,并且只能通过从间隙中移除等离子体或消除阴极电子发射(两者都很困难)或通过外加磁场限制这种下游电子流来消除。
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