Synthetic TEC Mapping with Kriging and Random Field Priors

I. Sayin, F. Arıkan, O. Arikan
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引用次数: 3

Abstract

Total electron content (TEC) can be used for analyzing the variability of the ionosphere in space and time. In this study, spatial interpolation is implemented by Kriging and random field priors (RFP), which are widely used in geostatistics. Performance of Kriging and RFP methods are analyzed on synthetic TEC data for different trend functions, sampling patterns, sampling numbers, variance and range values of covariance function which is used to simulate the synthetic data, by comparing the normalized errors of interpolations. In regular sampling patterns, as opposed to random sampling, the normalized average error is very close to each other for all methods and trend assumptions. The error increases with variance and decreases with range. As the number of samples increase, the normalized error also decreases.
基于Kriging和随机场先验的TEC合成映射
总电子含量(TEC)可以用来分析电离层在空间和时间上的变化。本研究采用Kriging和随机场先验(random field prior, RFP)方法实现空间插值,这两种方法在地统计学中应用广泛。通过比较插值的归一化误差,分析了Kriging和RFP方法在不同趋势函数、采样方式、采样个数、模拟合成数据的协方差函数的方差和极差值的综合TEC数据上的性能。在常规抽样模式中,与随机抽样相反,所有方法和趋势假设的归一化平均误差彼此非常接近。误差随方差增大,随距离减小。随着样本数量的增加,归一化误差也减小。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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