A novel method for monitoring state and evaluating health of analog circuit

Abstract

Aiming at monitoring health degradation of analog circuit, the paper proposes a new method about state monitoring and health evaluation. Firstly original voltage features are extracted from analog circuit with some components changing gradually; Then LDA is used to reduce the dimension of the original features to obtain effective features; In the following with the effective features of normal state, a DHMM trained by an improved training algorithm is applied to calculate KL distance to monitor analog circuit's state and evaluate its health. Applying this new method to an analog circuit, the experiment results show that the proposed method can successfully convert the unconspicuous change of early fault process into the obvious change of KL distance and owns excellent capability of state monitoring.