{"title":"An adaptive, low-cost wear-leveling algorithm for multichannel solid-state disks","authors":"Li-Pin Chang, Tung-Yang Chou, Li-Chun Huang","doi":"10.1145/2539036.2539051","DOIUrl":null,"url":null,"abstract":"Multilevel flash memory cells double or even triple storage density, producing affordable solid-state disks for end users. As flash memory endures only limited program-erase cycles, solid-state disks employ wear-leveling methods to prevent any portions of flash memory from being retired prematurely. Modern solid-state disks must consider wear evenness at both block and channel levels. This study first presents a block-level wear-leveling method whose design has two new ideas. First, the proposed method reuses the intelligence available in flash-translation layers so it does not require any new data structures. Second, it adaptively tunes the threshold of block-level wear leveling according to the runtime write pattern. This study further introduces a new channel-level wear-leveling strategy, because block-level wear leveling is confined to a channel, but realistic workloads do not evenly write all channels. The proposed method swaps logical blocks among channels for achieving an eventually-even state of channel lifetimes. A series of trace-driven simulations show that our wear-leveling method outperforms existing approaches in terms of wear evenness and overhead reduction.","PeriodicalId":183677,"journal":{"name":"ACM Trans. Embed. Comput. Syst.","volume":"18 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"17","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"ACM Trans. Embed. Comput. Syst.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/2539036.2539051","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 17
Abstract
Multilevel flash memory cells double or even triple storage density, producing affordable solid-state disks for end users. As flash memory endures only limited program-erase cycles, solid-state disks employ wear-leveling methods to prevent any portions of flash memory from being retired prematurely. Modern solid-state disks must consider wear evenness at both block and channel levels. This study first presents a block-level wear-leveling method whose design has two new ideas. First, the proposed method reuses the intelligence available in flash-translation layers so it does not require any new data structures. Second, it adaptively tunes the threshold of block-level wear leveling according to the runtime write pattern. This study further introduces a new channel-level wear-leveling strategy, because block-level wear leveling is confined to a channel, but realistic workloads do not evenly write all channels. The proposed method swaps logical blocks among channels for achieving an eventually-even state of channel lifetimes. A series of trace-driven simulations show that our wear-leveling method outperforms existing approaches in terms of wear evenness and overhead reduction.