A Discriminator Controlled Broad-band Optical Microwave Source

M. Lewis, P. Sample
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This can be seen from the two laser signals: E1 = exp(jolt + a) (1 1 E2 = exp(jo2t + p) (2) The phase perturbations a and p give rise to phase noise sidebands. When the laser signals are combined and the difference frequency, (01 o2), is recovered using an optical detector, a and p will appear on the detector output, irrespective of the value of the difference frequency. This contrasts with quartz crystal derived microwave sources where the level of phase fluctuations and the concomitant sidebands rises rapidly with the order of frequency multiplication. The orally reported results extended to 20GHz, at which frequency the phase noise performance of the laser source was essentially the same as a Hewlett Packard 83711A Frequency Synthesiser. However these measurements were so close to the measurement floor of the instrumentation that they could not be regarded as absolute and simply confirmed the equivalence of the laser source to a high quality synthesiser. This problem is exacerbated at higher frequencies and a new measurement technique has therefore been devised and is described below. A two laser microwave source is now described which covers the frequency range of 27 to 40GHz, The actual frequency range evaluated being defined by the microwave components used in this particular experimental configuration and not the optics. The original phase noise measurements' were made using a Hewlett Packard 8565E Spectrum Analyser with an 85671A Phase Noise Measurement Utility. As this was unsuitable for measurements at frequencies up to 40GHz an alternative approach was used. Since the optical discriminator provides a reference for reducing phase noise sidebands it also provides a very convenient means for the measurement of these components. These appear at the discriminator output as the demodulated FM noise spectrum which can be readily converted to the phase noise spectrum of the two laser microwave source. This technique has the added advantage of yielding much higher sensitivities than the spectrum analyser approach. This has allowed much more accurate measurements to be made at offset frequencies above 1 OKHz, where the measurement sensitivity is greater than -1 40dBdHz compared with -1 1 OdBclHz for the spectrum analyser method. It has been checked that this system is consistent with the spectrum analyser at lower frequencies. This technique for phase noise measurement could readily be adapted for use with conventional low noise microwave sources. Svstem Description Figure 1 shows the elements of the two laser source. The outputs of Lasers 1 and 2 are combined in an optical coupler to produce an intensity modulation having a frequency equal to the laser difference frequency. A polarisation controller in series with the output of Laser 1 allows the index of this intensity modulation to be optimised. 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引用次数: 5

Abstract

The difference frequency of two lasers is stabilised by an optical discriminator to provide a low noise source programmable from 27 to 40 GHz. A novel phase noise measurement technique is described using the optical discriminator itself. Introduction A paper' was presented at the 1996 lntemational Topical Meeting on Microwave Photonics which described a microwave source consisting of two lasers having their difference frequency stabilised by an optical discriminator. Measurements of phase noise, for an output frequency of GOOMHz, were included in that paper to demonstrate the phase noise improvement which could be obtained with the optical discriminator. The paper postulated that the phase noise spectrum is independent of output frequency and results confirming this were presented orally at the above meeting. This can be seen from the two laser signals: E1 = exp(jolt + a) (1 1 E2 = exp(jo2t + p) (2) The phase perturbations a and p give rise to phase noise sidebands. When the laser signals are combined and the difference frequency, (01 o2), is recovered using an optical detector, a and p will appear on the detector output, irrespective of the value of the difference frequency. This contrasts with quartz crystal derived microwave sources where the level of phase fluctuations and the concomitant sidebands rises rapidly with the order of frequency multiplication. The orally reported results extended to 20GHz, at which frequency the phase noise performance of the laser source was essentially the same as a Hewlett Packard 83711A Frequency Synthesiser. However these measurements were so close to the measurement floor of the instrumentation that they could not be regarded as absolute and simply confirmed the equivalence of the laser source to a high quality synthesiser. This problem is exacerbated at higher frequencies and a new measurement technique has therefore been devised and is described below. A two laser microwave source is now described which covers the frequency range of 27 to 40GHz, The actual frequency range evaluated being defined by the microwave components used in this particular experimental configuration and not the optics. The original phase noise measurements' were made using a Hewlett Packard 8565E Spectrum Analyser with an 85671A Phase Noise Measurement Utility. As this was unsuitable for measurements at frequencies up to 40GHz an alternative approach was used. Since the optical discriminator provides a reference for reducing phase noise sidebands it also provides a very convenient means for the measurement of these components. These appear at the discriminator output as the demodulated FM noise spectrum which can be readily converted to the phase noise spectrum of the two laser microwave source. This technique has the added advantage of yielding much higher sensitivities than the spectrum analyser approach. This has allowed much more accurate measurements to be made at offset frequencies above 1 OKHz, where the measurement sensitivity is greater than -1 40dBdHz compared with -1 1 OdBclHz for the spectrum analyser method. It has been checked that this system is consistent with the spectrum analyser at lower frequencies. This technique for phase noise measurement could readily be adapted for use with conventional low noise microwave sources. Svstem Description Figure 1 shows the elements of the two laser source. The outputs of Lasers 1 and 2 are combined in an optical coupler to produce an intensity modulation having a frequency equal to the laser difference frequency. A polarisation controller in series with the output of Laser 1 allows the index of this intensity modulation to be optimised. The output of the optical coupler is applied directly to Detector 2 and via a fibre-optic delay line to Detector 1 to recover the laser difference frequency. If the delay of the fibre-optic delay line is Td seconds, then the relative phase of the two detector outputs will vary at a rate equal to 2xTd rads/Hz as the difference frequency is varied. The phase sensitive detector, (PSD), senses this phase difference to produce a feedback signal which is applied to the control loop amplifier to produce an error voltage to correct the frequency of Laser 2. The control loop will therefore improve the stability of the laser difference frequency towards a value determined by the discriminator control characteristic. The degree of improvement is determined by the excess open loop gain in the control loop. The PSD output and hence the discriminator output will be a replica of the PSD transfer characteristic and will repeat every lmd in laser difference frequency. If the PSD gain equals Kp voltdradian and the static discriminator gain is KO volts/radian/sec, then, & = KpTd volts/rad/sec (3) This assumes the PSD has a sinusoidal characteristic and the inputs are in quadrature. Control LOOD Desian The open loop frequency response of the control loop, G(jw)H(jw), is given by: G(jo)H(jo) = KI&&e-l”TdGl(j~t) (4) Where: K1 = loop amplifier gain Laser 2 Gl(jo) = frequency response of loop filter. = tuning sensitivity of The following filter configuration was used for Glow) in the experimental work: Gl(jw) = (1 + joTI)(l + joT3) (5)
一种鉴别器控制的宽带光微波源
两个激光器的差频由一个光学鉴别器稳定,以提供一个低噪声源,可编程从27到40 GHz。介绍了一种利用光鉴频器测量相位噪声的新技术。1996年国际微波光子学专题会议上发表了一篇论文,描述了一种由两个激光组成的微波源,其差频由光学鉴别器稳定。本文还对输出频率为GOOMHz的相位噪声进行了测量,以证明使用光学鉴别器可以获得相位噪声的改善。本文假设相位噪声频谱与输出频率无关,并在上述会议上口头提出了证实这一点的结果。这可以从两个激光信号中看出:E1 = exp(jolt + a) (1 1 E2 = exp(jo2t + p))(2)相位扰动a和p产生相位噪声边带。当激光信号组合并使用光学探测器恢复差频(01 o2)时,无论差频的值如何,探测器输出上会出现a和p。这与石英晶体衍生的微波源形成对比,其中相位波动水平和伴随的边带随着频率倍增的顺序迅速上升。口头报告的结果扩展到20GHz,在该频率下,激光源的相位噪声性能基本上与惠普83711A频率合成器相同。然而,这些测量是如此接近测量地板的仪器,他们不能被视为绝对的,只是确认等效的激光源的高质量合成器。这个问题在更高的频率下加剧,因此设计了一种新的测量技术,如下所述。现在描述了一个双激光微波源,其频率范围为27至40GHz,实际的频率范围是由在这个特定的实验配置中使用的微波元件而不是光学元件来定义的。原始相位噪声测量是使用惠普8565E频谱分析仪与85671A相位噪声测量实用程序。由于这种方法不适用于频率高达40GHz的测量,因此采用了另一种方法。由于光鉴别器提供了降低相位噪声边带的参考,它也为这些分量的测量提供了非常方便的手段。这些在鉴别器输出处以解调的调频噪声谱的形式出现,可以很容易地转换为两个激光微波源的相位噪声谱。这种技术的附加优点是产生比频谱分析仪方法高得多的灵敏度。这使得在1 OKHz以上的偏移频率上进行更精确的测量成为可能,其中测量灵敏度大于-1 40dBdHz,而频谱分析仪方法的测量灵敏度为-1 1odbclhz。经检验,该系统在较低频率下与频谱分析仪相一致。这种相位噪声测量技术可以很容易地适用于传统的低噪声微波源。系统描述图1显示了两个激光源的组成。激光器1和2的输出在光耦合器中组合以产生频率等于激光差频的强度调制。与激光1输出串联的偏振控制器允许该强度调制的指数得到优化。光耦合器的输出直接作用于探测器2,并通过光纤延迟线作用于探测器1以恢复激光差频。如果光纤延迟线的延迟为Td秒,则随着差频的变化,两个检测器输出的相对相位将以等于2xTd rad /Hz的速率变化。相敏检测器,(PSD),感知这个相位差,产生一个反馈信号,该信号被应用到控制环路放大器,产生一个误差电压,以纠正激光2的频率。因此,控制回路将提高激光差频向鉴别器控制特性所决定的值的稳定性。改进的程度是由控制环中多余的开环增益决定的。PSD输出和鉴别器输出将是PSD传输特性的复制品,并将重复激光差频中的每个lmd。如果PSD增益等于Kp伏/弧度,静态鉴别器增益为KO伏/弧度/秒,则,& = KpTd伏/弧度/秒(3)这假设PSD具有正弦特性并且输入是正交的。 控制回路的开环频率响应G(jw)H(jw)由下式给出:G(jo)H(jo) = KI&&e-l”TdGl(j~t)(4)式中:K1 =环路放大器增益激光2gl (jo) =环路滤波器频率响应。实验工作中Glow使用的滤波器配置如下:Gl(jw) = (1 + joTI)(l + joT3) (5)
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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