High Performance Mixed Signal and RF Circuits Enabled by the Direct Monolithic Heterogeneous Integration of GaN HEMTs and Si CMOS on a Silicon Substrate

T. Kazior, R. Chelakara, W. Hoke, J. Bettencourt, T. Palacios, H. S. Lee
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引用次数: 46

Abstract

In this work we present recent results on the direct heterogeneous integration of GaN HEMTs and Si CMOS on a silicon substrate. GaN HEMTs whose DC and RF performance are comparable to GaN HEMTs on SiC substrates have been achieved. As a demonstration vehicle we designed and fabricated a GaN amplifier with pMOS gate bias control circuitry (a current mirror) and heterogeneous interconnects. This simple demonstration circuit is a building block for more advanced RF, mixed signal and power conditioning circuits, such as reconfigurable or linearized PAs with in-situ adaptive bias control, high power digital-to-analog converters (DACs), driver stages for on-wafer optoelectronics, and on-chip power distribution networks.
在硅衬底上直接单片异构集成GaN hemt和Si CMOS实现高性能混合信号和射频电路
在这项工作中,我们介绍了在硅衬底上直接异质集成GaN hemt和Si CMOS的最新结果。GaN hemt的直流和射频性能与SiC衬底上的GaN hemt相当。作为示范载体,我们设计并制造了一个具有pMOS门偏置控制电路(电流镜)和异质互连的GaN放大器。这个简单的演示电路是更先进的射频,混合信号和功率调节电路的构建模块,例如具有原位自适应偏置控制的可重构或线性化PAs,高功率数模转换器(dac),片上光电子器件的驱动级和片上配电网络。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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