An 18nm ePCM with BJT selector NVM design for advanced microcontroller applications

A. Conte, Francesco Tomaiuolo, Marco Ruta, A. Redaelli, F. Arnaud, T. Jouanneau, C. Boccaccio, O. Weber
{"title":"An 18nm ePCM with BJT selector NVM design for advanced microcontroller applications","authors":"A. Conte, Francesco Tomaiuolo, Marco Ruta, A. Redaelli, F. Arnaud, T. Jouanneau, C. Boccaccio, O. Weber","doi":"10.1109/IMW56887.2023.10145983","DOIUrl":null,"url":null,"abstract":"In this paper, the competitive advantage of Phase Change Memory (PCM) with BJT selector in 18nm FDSOI technology is explained. Starting from Microcontrollers requirements and architectures, the impact of technology features and device flavor in high performance and low-cost Microcontrollers is analyzed in section I, while the peculiarities of ePCM cell with BJT selector and its high-density advantages vs other NVM Back End solutions are illustrated in section II. The ePCM NVM IP Architecture constraints are presented in section III with particular emphasis on the need to split the arrays in Tiles. In section IV the impact of BJT selector in Reading Architecture is discussed showing the limits of classical solution and introducing a reading technique using multiple voltage domains sensing for Low Power Micros. Experimental results on a dedicated Test Vehicle are illustrated in section V.","PeriodicalId":153429,"journal":{"name":"2023 IEEE International Memory Workshop (IMW)","volume":"69 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2023-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2023 IEEE International Memory Workshop (IMW)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IMW56887.2023.10145983","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

In this paper, the competitive advantage of Phase Change Memory (PCM) with BJT selector in 18nm FDSOI technology is explained. Starting from Microcontrollers requirements and architectures, the impact of technology features and device flavor in high performance and low-cost Microcontrollers is analyzed in section I, while the peculiarities of ePCM cell with BJT selector and its high-density advantages vs other NVM Back End solutions are illustrated in section II. The ePCM NVM IP Architecture constraints are presented in section III with particular emphasis on the need to split the arrays in Tiles. In section IV the impact of BJT selector in Reading Architecture is discussed showing the limits of classical solution and introducing a reading technique using multiple voltage domains sensing for Low Power Micros. Experimental results on a dedicated Test Vehicle are illustrated in section V.
具有BJT选择器的18nm ePCM,用于高级微控制器应用
本文阐述了带BJT选择器的相变存储器(PCM)在18nm FDSOI技术中的竞争优势。从微控制器的要求和架构出发,在第一节中分析了技术特征和设备风格对高性能和低成本微控制器的影响,而在第二节中说明了带有BJT选择器的ePCM电池的特点及其相对于其他NVM后端解决方案的高密度优势。ePCM NVM IP架构的约束在第三节中介绍,特别强调在tile中拆分数组的需要。在第四节中,讨论了BJT选择器在读取架构中的影响,展示了经典解决方案的局限性,并介绍了一种使用低功耗微处理器的多电压域传感的读取技术。在专用试验车上的试验结果见第五节。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信