{"title":"Logic fault simulation on a vector hypercube multiprocessor","authors":"F. Özgüner, C. Aykanat, O. Khalid","doi":"10.1145/63047.63064","DOIUrl":null,"url":null,"abstract":"Fault simulation is the process of simulating the response of a logic circuit to input patterns in the presence of all possible single faults and is an essential part of test generation for VLSI circuits. Parallelization of the deductive and parallel simulation methods, on a hypercube multiprocessor and vectorization of the parallel simulation method are described. Experimental results are presented.","PeriodicalId":299435,"journal":{"name":"Conference on Hypercube Concurrent Computers and Applications","volume":"57 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1989-01-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"25","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Conference on Hypercube Concurrent Computers and Applications","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/63047.63064","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 25
Abstract
Fault simulation is the process of simulating the response of a logic circuit to input patterns in the presence of all possible single faults and is an essential part of test generation for VLSI circuits. Parallelization of the deductive and parallel simulation methods, on a hypercube multiprocessor and vectorization of the parallel simulation method are described. Experimental results are presented.