A 180-nm SiGe BiCMOS Wideband Amplifier For Cryogenic Applications

Wei-Chi Hsu, Yen-Chung Chiang
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Abstract

A wideband amplifier designed in a 180-nm SiGe BiCMOS process technology for cryogenic applications is proposed in this conference paper. By using the common-base stage as the input stage and the emitter follower as the final stage, it can have a wideband input/output matching. The proposed amplifier had been test at room temperature by probing test and in a 4K environment by on-board test and it achieved a peak measured gain of 18.95 dB at room temperature and 25 dB gain at 4K. The measured lowest noise Figure (NF) is between 5.8 to 6.4 dB at room temperature. The proposed circuit draws a 13.52 mW dc-power at room temperature and 12.95 mW at 4K from a 2.0-V supply.
用于低温应用的180nm SiGe BiCMOS宽带放大器
本文提出了一种基于180nm SiGe BiCMOS工艺设计的低温宽带放大器。采用共基级作为输入级,发射极跟随器作为末级,可以实现宽带输入/输出匹配。该放大器在室温下进行了探测测试,在4K环境下进行了车载测试,室温下的峰值测量增益为18.95 dB, 4K环境下的峰值测量增益为25 dB。在室温下测得的最低噪声系数(NF)在5.8 ~ 6.4 dB之间。所提出的电路在室温下吸收13.52兆瓦的直流功率,在4K下从2.0 v电源吸收12.95兆瓦的直流功率。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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