S-parameter measurements yielding the characteristic matrices of MTLs

Proceedings of the 1998 South African Symposium on Communications and Signal Processing-COMSIG '98 (Cat. No. 98EX214) Pub Date : 1998-09-07 DOI:10.1109/COMSIG.1998.736966

J. van der Merwe, H. Reader, J. Cloete

引用次数: 1

Abstract

A frequency domain method is presented which yields accurate characteristic matrices of uniform multiconductor transmission lines (MTLs). It uses simple two-port network analyzer S-parameter measurements of a set of open-circuit and short-circuited MTL configurations. Transversely inhomogeneous MTLs can be characterized accurately in their quasi-TEM propagation regime. The technique was used to determine the inductance and capacitance matrices of a low loss three conductor ribbon cable above a ground plane. Comparisons with numerically and analytically obtained data are given. Measurements are found to be repeatable for lines of length l

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s参数测量产生mtl的特征矩阵

提出了一种频域方法，可以得到均匀多导体传输线的精确特征矩阵。它使用简单的双端口网络分析仪s -参数测量一组开路和短路MTL配置。横向非均匀MTLs可以在准tem传播状态下精确表征。利用该技术测定了低损耗三导体带状电缆在地平面上的电感和电容矩阵。并与数值和解析得到的数据进行了比较。对于长度为l

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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