{"title":"Design of Tri-Gate Schottky Barrier Graphene Nanoribbon field effect transistor","authors":"Kandrakota Madhu Sai Krishna, B. T. Sundari","doi":"10.1109/ICCPCT.2017.8074167","DOIUrl":null,"url":null,"abstract":"Single gate transistors will show a diverse effects after reaching the absolute limits of the scaling like short-channel effects and electrostatic effects. In this paper Tri-Gate Schottky Barrier Graphene Nanoribbon FET is proposed to suppress the effects of short-channel effects and increases the performance without increasing the width of the transistor. As the length of the channel increases the probability of electron being scattered from source to drain decreases so back scattering effect has been introduced for the exact analysis and the tri-gate concept has been introduced to increase the drain current. The results shown a tremendous increase in the drain current with this new design.","PeriodicalId":208028,"journal":{"name":"2017 International Conference on Circuit ,Power and Computing Technologies (ICCPCT)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-04-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 International Conference on Circuit ,Power and Computing Technologies (ICCPCT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICCPCT.2017.8074167","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Single gate transistors will show a diverse effects after reaching the absolute limits of the scaling like short-channel effects and electrostatic effects. In this paper Tri-Gate Schottky Barrier Graphene Nanoribbon FET is proposed to suppress the effects of short-channel effects and increases the performance without increasing the width of the transistor. As the length of the channel increases the probability of electron being scattered from source to drain decreases so back scattering effect has been introduced for the exact analysis and the tri-gate concept has been introduced to increase the drain current. The results shown a tremendous increase in the drain current with this new design.