{"title":"Fabric defect detection using local homogeneity and morphological image processing","authors":"A. Rebhi, S. Abid, F. Fnaiech","doi":"10.1109/IPAS.2016.7880062","DOIUrl":null,"url":null,"abstract":"In this paper, a new fabric detect detection algorithm based on local homogeneity and mathematical morphology is presented. In a first step, the local homogeneity of each pixel is computed to construct a new homogeneity image denoted as (H-image). Then a classical histogram is computed for the H-image to choose an optimal thresholding value to produce a corresponding binary image, which will be used to extract the optimal size and the shape of the Structuring Element (SE) for mathematical morphology. In a second step, the image is subjected to a series of morphological operations with this SE to detect the possible existing fabric defect. Simulation results exhibit accurate defect detection with low false alarms.","PeriodicalId":283737,"journal":{"name":"2016 International Image Processing, Applications and Systems (IPAS)","volume":"10 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"20","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 International Image Processing, Applications and Systems (IPAS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IPAS.2016.7880062","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 20
Abstract
In this paper, a new fabric detect detection algorithm based on local homogeneity and mathematical morphology is presented. In a first step, the local homogeneity of each pixel is computed to construct a new homogeneity image denoted as (H-image). Then a classical histogram is computed for the H-image to choose an optimal thresholding value to produce a corresponding binary image, which will be used to extract the optimal size and the shape of the Structuring Element (SE) for mathematical morphology. In a second step, the image is subjected to a series of morphological operations with this SE to detect the possible existing fabric defect. Simulation results exhibit accurate defect detection with low false alarms.