The Evaluation of the Embedded Software Quality Based on the Binary Code

Jinshuo Liu, Yusen Chen, Lanxin Zhang, Juan Deng, Weixin Zhang
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引用次数: 3

Abstract

The embedded software quality is one of the hottest research aspects with the wide use of the daily embedded devices. This paper proposes a method of evaluating the embedded software quality without high-level language. Firstly, we reverse the binary code into high-level language C. Secondly, the control flow and data flow analysis are utilized to analyze the structure faults of the codes. Thirdly, we create the utilization-oriented fault models and plug in the improved CppCheck tool to chase the specified faults. Fourthly, we propose a software reliability evaluation algorithm based on trigger rate of fault to assess the quality of the embedded software. Our method is evaluated on ST chips of the smart meter, with the corresponding source code. Compared with G-O model, our software reliability evaluation method is useful and simpler.
基于二进制码的嵌入式软件质量评价
随着日常嵌入式设备的广泛应用,嵌入式软件质量已成为研究的热点之一。提出了一种无需高级语言的嵌入式软件质量评价方法。首先,我们将二进制代码转换成高级语言c语言,然后利用控制流和数据流分析来分析代码的结构故障。第三,我们建立了面向利用率的故障模型,并插入改进的CppCheck工具来追踪指定的故障。第四,提出了一种基于故障触发率的软件可靠性评估算法,对嵌入式软件的质量进行评估。我们的方法在智能电表的ST芯片上进行了评估,并附有相应的源代码。与G-O模型相比,本文提出的软件可靠性评估方法简单实用。
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