Multiple Reflect Technique for Wideband One-Port VNA Calibration

Abstract

We present a statistical technique for one-port vector network analyzer (VNA) calibration based on multiple reflect and a single reference standards. The multiple reflect standards are assumed to be partly unknown and of the same type, e.g. offset terminations. Their reflection coefficients are modeled over frequency and identified during the calibration along with the VNA error terms. This novel technique is particularly useful for millimeter-wave VNA calibrations in which conventional transmission line standards and the TRL method become impractical. Experimental verification shows that the accuracy of our technique is very high and comparable with the one-port measurement accuracy of the multiline TRL method.