Vamshi Veesam, Ramana Thakkallapally, I. Abdel-Motaleb, Zheng Shen
{"title":"Critical electric field and self-heating in 3D SiC/Si MOSFETs","authors":"Vamshi Veesam, Ramana Thakkallapally, I. Abdel-Motaleb, Zheng Shen","doi":"10.1109/EIT.2015.7293417","DOIUrl":null,"url":null,"abstract":"In this paper we evaluated the electric field and self-heating temperature of 3D 3C-SiC/Si MOSFETs. Using the numerical analysis simulator Silvaco Atlas, this device was found to have a critical electric field of 6.68×106 V/cm at a breakdown voltage close to 312V. Using COMSOL program, self-heating effect was investigated, and found that the temperature reached 866K at VDS=312V and VGS=5V.","PeriodicalId":415614,"journal":{"name":"2015 IEEE International Conference on Electro/Information Technology (EIT)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-05-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 IEEE International Conference on Electro/Information Technology (EIT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EIT.2015.7293417","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
In this paper we evaluated the electric field and self-heating temperature of 3D 3C-SiC/Si MOSFETs. Using the numerical analysis simulator Silvaco Atlas, this device was found to have a critical electric field of 6.68×106 V/cm at a breakdown voltage close to 312V. Using COMSOL program, self-heating effect was investigated, and found that the temperature reached 866K at VDS=312V and VGS=5V.