High-Reliability Active Integrated Power Limiter with Sharp Compression Profile in Ka-Band in 130 nm SiGe Technology

Manuel Potércau, N. Deltimple, A. Ghiotto, O. Jardel, S. Rochette, H. Leblond, J. Villemazet
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Abstract

A power limiter with high input power handling (24 dB over the input compression point) and sharp compression profile (less than 1.5 dB between the output 1-dB compression point and the output saturated power) in Ka-band (17.3 GHz; 20.2 GHz) is presented in this paper. Moreover, the circuit shows a low phase distortion (<3°) which make it suitable for use in an analog pre-processing linearizing system. This performances are obtained thanks to a novel architecture based on a power amplifier topology. This work presents the architecture along with the design methodology. Reliability is studied at high input power condition using the safe operation area from the technology provider. Then, a prototype is designed on 130 nm BiCMOS technology from STMicroelectronics, measured and compared to the simulation and the state of art.
高可靠性有源集成功率限幅器,在130纳米SiGe技术中具有ka波段的锐利压缩轮廓
在ka频段(17.3 GHz)具有高输入功率处理(输入压缩点超过24 dB)和锐利压缩曲线(输出1-dB压缩点与输出饱和功率之间小于1.5 dB)的功率限制器;20.2 GHz),本文提出。此外,该电路显示出低相位失真(<3°),使其适合用于模拟预处理线性化系统。这种性能得益于基于功率放大器拓扑结构的新型结构。这项工作展示了体系结构以及设计方法。利用技术供应商提供的安全操作区域,研究了高输入功率条件下的可靠性。然后,采用意法半导体公司的130 nm BiCMOS技术设计了原型机,并对其进行了仿真和比较。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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