ACCURACY IMPROVEMENT OF A DEGRADATION MODEL FOR FAILURE PROGNOSIS OF MITER GATES

Chen Jiang, M. A. Vega, Michael D. Todd, Zhen Hu
{"title":"ACCURACY IMPROVEMENT OF A DEGRADATION MODEL FOR FAILURE PROGNOSIS OF MITER GATES","authors":"Chen Jiang, M. A. Vega, Michael D. Todd, Zhen Hu","doi":"10.12783/shm2021/36357","DOIUrl":null,"url":null,"abstract":"Aims to address the issue that the degradation model may not accurately represent the underly true degradation physics in failure prognostics of miter gates, this paper presents a framework for degradation model correction using historical strain measurements. A stochastic gap growth model with uncertain model parameters is employed as the simplified degradation model to predict the gap evolution. A dynamic model discrepancy quantification framework is then proposed to correct the simplified model by representing the model bias term as a data-driven surrogate model. After that, a maximum likelihood estimation method is developed to estimate the parameters of the data-driven surrogate model using strain measurements. Additionally, the uncertainty in the model parameters of the simplified model is reduced using Bayesian method. The corrected and updated simplified degradation model is then employed for failure prognostics of a miter gate. Results of a case study show that the updated degradation model can accurately predict multi-step ahead gap growth while performing damage prognostics and remaining useful life estimation.","PeriodicalId":180083,"journal":{"name":"Proceedings of the 13th International Workshop on Structural Health Monitoring","volume":"57 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-03-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 13th International Workshop on Structural Health Monitoring","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.12783/shm2021/36357","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

Aims to address the issue that the degradation model may not accurately represent the underly true degradation physics in failure prognostics of miter gates, this paper presents a framework for degradation model correction using historical strain measurements. A stochastic gap growth model with uncertain model parameters is employed as the simplified degradation model to predict the gap evolution. A dynamic model discrepancy quantification framework is then proposed to correct the simplified model by representing the model bias term as a data-driven surrogate model. After that, a maximum likelihood estimation method is developed to estimate the parameters of the data-driven surrogate model using strain measurements. Additionally, the uncertainty in the model parameters of the simplified model is reduced using Bayesian method. The corrected and updated simplified degradation model is then employed for failure prognostics of a miter gate. Results of a case study show that the updated degradation model can accurately predict multi-step ahead gap growth while performing damage prognostics and remaining useful life estimation.
人字门失效预测退化模型精度的提高
针对人字门失效预测中退化模型不能准确反映真实退化物理特性的问题,提出了一种利用历史应变测量对退化模型进行校正的框架。采用模型参数不确定的随机间隙生长模型作为简化退化模型来预测间隙演化。然后提出了一个动态模型偏差量化框架,通过将模型偏差项表示为数据驱动的代理模型来修正简化模型。在此基础上,提出了一种最大似然估计方法,利用应变测量来估计数据驱动代理模型的参数。此外,采用贝叶斯方法降低了简化模型中模型参数的不确定性。将修正后的简化退化模型用于人字门的失效预测。实例研究结果表明,改进后的退化模型在进行损伤预测和剩余使用寿命估算的同时,能够准确预测多步间隙增长。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信