A design and test technique for embedded software

Byeongdo Kang, Young-Jik Kwon, R. Lee
{"title":"A design and test technique for embedded software","authors":"Byeongdo Kang, Young-Jik Kwon, R. Lee","doi":"10.1109/SERA.2005.6","DOIUrl":null,"url":null,"abstract":"In recent years, embedded systems have become so complex and the development time to market is required to be shorter than before. As embedded systems include more functions for new services, embedded software gradually grow in size, and development costs and time are increasing. In order to overcome this serious matter, we need a customized design and test technique for embedded software. In this paper, we present a software architecture style for embedded software. It facilitates the composition of reusable functions and helps developers to reduce development time. Because the costs associated with revealing errors of embedded software in applications are rising, we propose a test method and tools for target environments.","PeriodicalId":424175,"journal":{"name":"Third ACIS Int'l Conference on Software Engineering Research, Management and Applications (SERA'05)","volume":"149 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2005-08-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"28","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Third ACIS Int'l Conference on Software Engineering Research, Management and Applications (SERA'05)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SERA.2005.6","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 28

Abstract

In recent years, embedded systems have become so complex and the development time to market is required to be shorter than before. As embedded systems include more functions for new services, embedded software gradually grow in size, and development costs and time are increasing. In order to overcome this serious matter, we need a customized design and test technique for embedded software. In this paper, we present a software architecture style for embedded software. It facilitates the composition of reusable functions and helps developers to reduce development time. Because the costs associated with revealing errors of embedded software in applications are rising, we propose a test method and tools for target environments.
嵌入式软件的设计与测试技术
近年来,嵌入式系统变得越来越复杂,开发到市场的时间被要求比以前更短。随着嵌入式系统为新业务提供了更多的功能,嵌入式软件的规模逐渐扩大,开发成本和时间也在增加。为了克服这个严重的问题,我们需要一种定制的嵌入式软件设计和测试技术。本文提出了一种嵌入式软件的软件体系结构样式。它促进了可重用功能的组合,并帮助开发人员减少了开发时间。由于在应用程序中发现嵌入式软件错误的成本正在上升,我们提出了一种针对目标环境的测试方法和工具。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信