M. Schlie, J. Graf, F. Hertlein, P. Radcliffe, J. Wiesmann, C. Michaelsen
{"title":"Coordinated development of tubes and optics: new possibilities for x-ray sources","authors":"M. Schlie, J. Graf, F. Hertlein, P. Radcliffe, J. Wiesmann, C. Michaelsen","doi":"10.1117/12.2600153","DOIUrl":null,"url":null,"abstract":"In this talk, we will summarize the key parameters for combining multilayer optics and microfocus tubes to achieve collimated or focused X-ray sources with high brilliance. The main part of the talk will explain the application-dependent design and capabilities of our newly developed custom metal-ceramic tubes and how to match them with our advanced multilayer optics. Stand-alone custom tubes and optics made possible by the advanced knowledge of the two centerpieces of the source will also be covered. Applications include crystallography, detector calibration, or as a tool at synchrotrons during downtime or con-struction periods.","PeriodicalId":114930,"journal":{"name":"Advances in X-Ray/EUV Optics and Components XVI","volume":"22 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Advances in X-Ray/EUV Optics and Components XVI","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1117/12.2600153","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
In this talk, we will summarize the key parameters for combining multilayer optics and microfocus tubes to achieve collimated or focused X-ray sources with high brilliance. The main part of the talk will explain the application-dependent design and capabilities of our newly developed custom metal-ceramic tubes and how to match them with our advanced multilayer optics. Stand-alone custom tubes and optics made possible by the advanced knowledge of the two centerpieces of the source will also be covered. Applications include crystallography, detector calibration, or as a tool at synchrotrons during downtime or con-struction periods.