Influence of the Correlation Coefficients in Determining Circuit Compatibility at HF

D. Sailors
{"title":"Influence of the Correlation Coefficients in Determining Circuit Compatibility at HF","authors":"D. Sailors","doi":"10.1109/ISEMC.1979.7568837","DOIUrl":null,"url":null,"abstract":"The sensitivity of the circuit compatibility calculation at hf to input correlation coefficients is examined. The results show that the values of the correlation coefficients used have significant effect. But the change in circuit compatibility during the daytime was primarily due to the change in the correlation coefficient between the signal-to-noise ratio (S-N) and the interference-to-noise ratio (I-N) rather than the correlation between the interfering and desired path MUFs.","PeriodicalId":283257,"journal":{"name":"1979 IEEE International Symposium on Electromagnetic Compatibility","volume":"8 1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1979-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1979 IEEE International Symposium on Electromagnetic Compatibility","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEMC.1979.7568837","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

The sensitivity of the circuit compatibility calculation at hf to input correlation coefficients is examined. The results show that the values of the correlation coefficients used have significant effect. But the change in circuit compatibility during the daytime was primarily due to the change in the correlation coefficient between the signal-to-noise ratio (S-N) and the interference-to-noise ratio (I-N) rather than the correlation between the interfering and desired path MUFs.
高频相关系数对确定电路兼容性的影响
考察了高频电路兼容性计算对输入相关系数的敏感性。结果表明,所采用的相关系数的取值具有显著的影响。但是,白天电路兼容性的变化主要是由于信噪比(S-N)和干扰噪声比(I-N)之间的相关系数的变化,而不是干扰和期望路径muf之间的相关性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信