Surface Regularity Modeling And Measurement Using Frequency Diverse Radar Measurements

Abstract

The distribution of elemental scatterers on a surface imaged by a synthetic aperture radar (SAR) s y s tem, is modelled as a parametric point process. By describing the surface structure on very small scales, the proposed surface regularity model can account for the effects of sub-resolution structure on the observed signals. The effects are most noticeable in the frequency domain, suggesting that frequency diverse measurements may provide a usefui methdd for estimating the model parameters. Simulation results are presented to illustrate these effects, and directions for further research are suggested.