The miller effect in digital CMOS gates and power consumption analysis

I. Brzozowski, A. Kos
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引用次数: 3

Abstract

This paper deals with the Miller Effect occurrence in standard CMOS gates and possibility to take it into considerations during power dissipation analysis. Internal capacitances occurring in MOS transistors give the effect of capacitive coupling between input and output of the gate. It seems that the Miller theorem can be applied in a simplified approach to the analysis of energy and time in static CMOS gates. The main purpose of this paper is to discuss whether the Miller theorem can be effectively used in the analysis of energy and time in CMOS gates. What is the accuracy of such approach and what are the limitations? Theoretical considerations are supplemented by simulations.
数字CMOS门中的米勒效应及功耗分析
本文讨论了标准CMOS门中的米勒效应,以及在功耗分析中考虑米勒效应的可能性。MOS晶体管的内部电容在栅极的输入和输出之间产生电容耦合效应。看来,米勒定理可以应用于一个简化的方法来分析静态CMOS门的能量和时间。本文的主要目的是讨论米勒定理是否可以有效地用于CMOS门的能量和时间分析。这种方法的准确性和局限性是什么?通过模拟来补充理论考虑。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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