{"title":"Step stress accelerated reliability growth test method with latent failures","authors":"Hao Xing, Jun Yang","doi":"10.1080/16843703.2023.2240980","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":229439,"journal":{"name":"Quality Technology & Quantitative Management","volume":"11 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2023-07-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Quality Technology & Quantitative Management","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1080/16843703.2023.2240980","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}