FRoC 2.0

Ibrahim Ahmed, Shuze Zhao, James Meijers, O. Trescases, Vaughn Betz
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Abstract

In earlier technology nodes, FPGAs had low power consumption compared to other compute chips such as CPUs and GPUs. However, in the 14nm technology node, FPGAs are consuming unprecedented power in the 100+W range, making power consumption a pressing concern. To reduce FPGA power consumption, several researchers have proposed deploying dynamic voltage scaling. While the previously proposed solutions show promising results, they have difficulty guaranteeing safe operation at reduced voltages for applications that use the FPGA hard blocks. In this work, we present the first DVS solution that is able to fully handle FPGA applications that use BRAMs. Our solution not only robustly tests the soft logic component of the application but also tests all components connected to the BRAMs. We extend a previously proposed CAD tool, FRoC, to automatically generate calibration bitstreams that are used to measure the application’s critical path delays on silicon. The calibration bitstreams also include testers that ensure all used SRAM cells operate safely while scaling Vdd. We experimentally show that using our DVS solution we can save 32% of the total power consumed by a discrete Fourier transform application running with the fixed nominal supply voltage and clocked at the Fmax reported by static timing analysis.
FRoC 2.0
在早期的技术节点中,与cpu和gpu等其他计算芯片相比,fpga的功耗较低。然而,在14nm技术节点上,fpga在100+W范围内消耗了前所未有的功率,使得功耗成为一个紧迫的问题。为了降低FPGA的功耗,一些研究人员提出了动态电压缩放的方案。虽然先前提出的解决方案显示出有希望的结果,但它们难以保证使用FPGA硬块的应用在降低电压下的安全运行。在这项工作中,我们提出了第一个能够完全处理使用bram的FPGA应用的DVS解决方案。我们的解决方案不仅可以健壮地测试应用程序的软逻辑组件,还可以测试连接到bram的所有组件。我们扩展了先前提出的CAD工具FRoC,以自动生成用于测量硅上应用程序关键路径延迟的校准比特流。校准比特流还包括测试器,确保所有使用的SRAM单元在缩放Vdd时安全运行。我们的实验表明,使用我们的分布式交换机解决方案,我们可以节省32%的总功耗的离散傅里叶变换应用程序运行与固定标称电源电压和时钟在静态时序分析报告的Fmax。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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