A unified built-in-test scheme: UBIST

Abstract

An original BIST (built-in self-test) scheme is proposed to cover some shortcomings of self-checking circuits and to ensure all tests needed for integrated circuits. In the BIST scheme, self-checking techniques and built-in self-test techniques are combined in an original way and take advantage one from the other. This results in a unified BIST scheme (UBIST), allowing a high fault coverage for all tests needed for integrated circuits, e.g. offline test (design verification, manufacturing test, and maintenance test) and online concurrent error detection.<>