Diagnosis of parametric faults in linear analog VLSI circuits

Abstract

In this paper we proposed a new approach for detection of faults in linear analog VLSI circuits. Our approach is very simple and efficient which is based on Signal Flow Graph. This approach is also used to calculate the tolerance of the component which is very important parameter of any VLSI circuit. In this paper we describe the whole method for testing of linear analog VLSI circuits and this approach is tested on two analog circuits. These are integrator circuit and MIMO circuit. All the model and the calculation for our approach is done with the help of MATLAB/Simulink Tool.